This presentation will help you understand the need for Pulsed S-Parameter Measurements. It discusses key points such as the devices and test methods required for Pulsed RF and or Pulsed IV applications, include Pulse Profiling, PIP, and P2P measurements, including when a test set is required for such measurements. An overview is also presented regarding how a Pulse signal is seen in both Time Domain and Frequency Domain. Descriptions of traditional test methods and historical trade-offs associated with such methods, ie Narrowband versus Wideband etc, and how they impact the final result. Common test challenges that engineers face and how they are countered with a modern VNA architecture. The value of Coupled IF Receiver Windows alongside a powerful User interface to facilitate such measurements easily.
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